Evaluation of CIMMYT germplasm for resistance to leaf spotting diseases of wheat
نویسندگان
چکیده
منابع مشابه
Analysis of the Masked Metabolite of Deoxynivalenol and Fusarium Resistance in CIMMYT Wheat Germplasm
Fusarium head blight (FHB) causes significant grain loss and contamination of grains with harmful mycotoxins, especially deoxynivalenol (DON). Fusarium resistance and DON accumulation have been extensively investigated in various cultivars; however, the level of DON-3-O-glucoside (D3G) has not been as carefully studied. In this study, we measured accumulated DON and D3G levels in CIMMYT wheat e...
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Tomato yellow leaf curl virus (TYLCV) is a major tomato virus in tropical and subtropical regions. In this study, 134 accessions of Solanum lycopersicum and six accessions of Solanum peruvianum were assessed for resistance to an Iranian isolate of TYLCV. Plants were inoculated using whiteflies (Bemisia tabaci) and the reaction of plants was evaluated based on either disease symptoms or viral DN...
متن کاملBreeding for Enhanced Zinc and Iron Concentration in CIMMYT Spring Wheat Germplasm
Micronutrient malnutrition, resulting from dietary deficiency of important minerals such as zinc (Zn) and iron (Fe), is a widespread food-related health problem. Genetic enhancement of crops with elevated levels of these micronutrients is one of the most cost effective ways of solving global micronutrient malnutrition problem. Development and dissemination of high Zn and Fe containing high-yiel...
متن کاملGenetic Dissection of Grain Size and Grain Number Trade-Offs in CIMMYT Wheat Germplasm
Grain weight (GW) and number per unit area of land (GN) are the primary components of grain yield in wheat. In segregating populations both yield components often show a negative correlation among themselves. Here we use a recombinant doubled haploid population of 105 individuals developed from the CIMMYT varieties Weebill and Bacanora to understand the relative contribution of these components...
متن کاملGenetics of Resistance to Wheat Leaf Rust1
Leaf rust (caused by Puccinia recondita f. sp. tritici) is the most widespread and regularly occurring rust on wheat. Genetic resistance is the most economical method of reducing yield losses due to leaf rust. To date, 46 leaf rust resistance genes have been designated and mapped in wheat. Resistance gene expression is dependent on the genetics of host-parasite interaction, temperature conditio...
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ژورنال
عنوان ژورنال: Czech Journal of Genetics and Plant Breeding
سال: 2011
ISSN: 1212-1975,1805-9325
DOI: 10.17221/3263-cjgpb